Membrane-Based Scanning Force Microscopy
نویسندگان
چکیده
We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our is made possible by inverting standard geometry - in our instrument, substrate vibrating and tip at rest. present first topography images samples placed surface. measurements demonstrate that retains excellent sensitivity when loaded with presence tip. discuss prospects limitations instrument as quantum-limited sensor imaging tool.
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ژورنال
عنوان ژورنال: Physical review applied
سال: 2021
ISSN: ['2331-7043', '2331-7019']
DOI: https://doi.org/10.1103/physrevapplied.15.l021001